Verification of logic gates

Aim: To verify and design AND, OR, NOT, XOR, XNOR using NAND gates Apparatus: NAND gates, digital interactive signals, probes, connecting wires, IC 7400 Circuit Diagrams: NOT gate                                                                  AND gate OR gate                                                                             XOR gate XNOR gate Result: AND, OR, NOT, XOR, XNOR gates are designed using NAND gates and verified according to their truth

Verification of logic gates Read More »

DIGITAL ELECTRONICS

TRIAC

AIM- To study the VI Characteristics of TRIAC with positive and negative biasing and plot the curve between V and I. APPARATUS- NV6532 Charactersiitc Trainer, Patch Cord, Wires THEORY- A semiconductor device that is used to control the negative and positive half cycles is called “TRIAC”. The word “tri” indicates that the device has three

TRIAC Read More »

SEMICONDUCTOR DEVICES EXPERIMENTS

DIAC

AIM- To study the VI characteristics of DIAC with positive biasing and plot the curve between V and I. APPARATUS- NV6531 Diac Characteristic Trainer, 2mm Patch Cord THEORY- The diac is a two-terminal device that has three semiconductor layers. It is a bidirectional diode, i.e. it can be made to conduct in either direction. This

DIAC Read More »

SEMICONDUCTOR DEVICES EXPERIMENTS

SCR

AIM- To study the VI characteristics of SCR. APPARATUS- NV6530 SCR Characteristics Trainer, Wires THEORY- SCR is a four-layered semiconductor device that is alternative of P-type and N-type semiconductor silicon. Junction J1, J2 and J3 (J1, J2 and J3 operate in forward direction while middle operates in reverse direction) and three terminals known as anode

SCR Read More »

SEMICONDUCTOR DEVICES EXPERIMENTS

Solar Cell

Aim: To plot the V-I characteristics of the solar cell Apparatus Required: Theory: A solar cell is a semiconductor device which converts solar energy into electrical energy. It is also called Photovoltaic cell. Solar cell works as a PN junction diode. A built in depletion region is generated in that without an applied reverse bias

Solar Cell Read More »

SEMICONDUCTOR DEVICES EXPERIMENTS

MOSFET

Metal Oxide Semiconductor Field Effect Transistor Aim: To study the V-I characteristics of MOSFET Apparatus Required: Theory: MOSFT stands for Metal Oxide Semiconductor Field Effect Transistor. It is actually a four terminal device whose substrate terminal must be always hold at one of the extreme voltage in the circuit either the most positive for PMOS

MOSFET Read More »

SEMICONDUCTOR DEVICES EXPERIMENTS

Hall effect

Aim :- 1. To determine the Hall voltage developed across the sample material.2. To calculate the Hall coefficient and the carrier concentration of the sample material. Apparatus:- Two solenoids, Constant current supply, Four probe, Digital gauss meter, Hall effect apparatus (which consist of Constant Current Generator (CCG), digital milli voltmeter and Hall probe). Theory :-If

Hall effect Read More »

SEMICONDUCTOR DEVICES EXPERIMENTS
Scroll to Top